Studi Pengujian X-Ray Diffraction (XRD) Pada Aluminium Silikon (Al-Si) Dengan Perlakuan Panas Artificial Aging 200⁰C

Mahmudi, iksan Alim and , Ir. Masyrukan, MT (2020) Studi Pengujian X-Ray Diffraction (XRD) Pada Aluminium Silikon (Al-Si) Dengan Perlakuan Panas Artificial Aging 200⁰C. Skripsi thesis, Universitas Muhammadiyah Surakarta.

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Abstract

The artificial aging process is an aging process for aluminum alloys that are aged hardening in a hot state. Artificial aging takes place at temperatures between 100°C-200°C and with a holding time between 1 to 24 hours. So in this study the artificial aging stage uses an artificial aging temperature of 200°C with a holding time of 2 hour and compares it with raw material. From the results of testing the chemical composition there are 16 elements, but only 3 elements are most influential namely (Si) 9.27%, (Fe) 2.07%, (Cu) 1.77% the most dominant. Judging from the elements present in this material can be classified as aluminum alloy aluminum metal (Al-Si). From the results of XRD test (X-Ray Diffraction) on the raw material there is a compound C with a density of 1.36 g/cm3, SiO2 with a density of 2.97 g/cm3, Al2O3 with a density of 5.04 g/cm3. From the results of XRD (X-Ray Diffraction) testing at aging 200 ° C, there are compound C with a density of 1.36 g/cm3, SiO2 with a density of 1.78 g/cm3, Al2O3 with a density of 3.75 g/cm3.

Item Type:	Karya ilmiah (Skripsi)
Uncontrolled Keywords:	Artificial Aging, XRD
Subjects:	Q Science > Q Science (General) T Technology > TJ Mechanical engineering and machinery
Divisions:	Fakultas Teknik > Teknik Mesin
Depositing User:	IKSAN ALIM MAHMUDI
Date Deposited:	13 Nov 2020 03:34
Last Modified:	13 Nov 2020 03:34
URI:	http://eprints.ums.ac.id/id/eprint/87265

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